| 000 | 00838nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | 000890192 | ||
| 005 | 20170508010312.0 | ||
| 008 | 120508s2011 |||a r 000 0 eng d | ||
| 040 | _aAM-YeHGA | ||
| 041 | 0 | _aeng | |
| 100 | 1 | _aBradbury, Michael H. | |
| 245 | 1 | 0 |
_aPhysico-chemical characterisation data and sorption measurements of Cs, Ni, Eu, Th, U, Cl, I and Se on MX-80 bentonite / _cMichael H. Bradbury, Bart Baeyens; Paul-Scherrer-Institut. |
| 260 |
_aVilligen, Switzerland : _bPaul Scherrer Institut, _c2011. |
||
| 300 |
_a42 p. : _bill. |
||
| 440 | 0 |
_aPaul Scherrer Institut Bericht _x1019-0643 _vNr. 11-05 |
|
| 440 | 0 |
_aPSI Bericht _vNr. 11-05 |
|
| 500 | _aDEcember 2011 | ||
| 504 | _aIncludes bibliogr. references : (p. 41-42) | ||
| 650 | 1 | 4 | _aNulear energy |
| 700 | 1 | _aBaeyens, Bart | |
| 710 | 2 | _aPaul Scherrer Institut | |
| 999 |
_c792880 _d792880 |
||