000			00594nam a2200193 a 4500
001			000861444
005			20230826100125.0
008			120125s1986 r 000 0 eng d
020			_a0-444-00989-2
041	0		_aeng
100	1		_aFeldman, Leonard C.
245	1	0	_aFundamentals of Surface and Thin Film Analysis / _cL.C. Feldman & J.W. Mayer.
260			_aNew York : _bElsevier Science Publishing Co., Inc., _c1986.
300			_a352 p. : _bfig.
504			_aIncludes Bibliographical References and Index.
650	1	4	_aMechanics of materials
700	1		_aMayer, J.W.
999			_c765262 _d765262
942			_cBK