000			00768pam a2200217 a 4500
001			000617916
003			AM-YeNLA
005			20190426141812.0
008			860220s1986 ne a b 000 0 eng d
020			_a0444878955 (U.S.)
040			_aDLC _cDLC _dDLC
041	0		_aeng
082	0	0	_a621.395 _219
245	0	0	_aVLSI testing / _cEd. by T.W. Williams.
260			_aAmsterdam ; _aNew York : _bNorth-Holland ; _aNew York, N.Y., U.S.A. : _bSole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., _c1986.
300			_aix, 275 p. : _bill. ; _c25 cm.
440		0	_aAdvances in CAD for VLSI _vVol. 5
504			_aIncludes bibliographies.
650		0	_aIntegrated circuits _xVery large scale integration _xTesting.
700	1		_aWilliams, T. W., _d1943- _4edt
999			_c539076 _d539076