000			00866nam a2200229 a 4500
001			000614214
003			AM-YeNLA
005			20231009072017.0
008			850621s1985 dcua b 001 0 eng d
020			_a0818606681 (pbk.)
020			_a0818646683 (microfiche)
041	0		_aeng
245	0	0	_aTutorial: VLSI testing & validation techniques / _c[Comp. by] Hassan K. Reghbati.
246	3	0	_aVLSI testing & validation techniques.
246	1	3	_aTutorial-VLSI texting and validation techniques.
260			_aWashington, D.C. ; _bIEEE Computer Society Press : _aLos Angeles, CA : _bOrder from IEEE Computer Society, _c1985.
300			_aix, 603 p. : _bill. ; _c28 cm.
504			_aIncludes bibliographies and indexes.
650		0	_aIntegrated circuits _xVery large scale integration _xTesting.
700	1		_aReghbati, Hassan K., _d1949- _4cmp
942			_2udc _cBK
999			_c535554 _d535554