| 000 | 00817cam a22002171 4500 | ||
|---|---|---|---|
| 001 | 000583362 | ||
| 003 | AM-YeNLA | ||
| 005 | 20190426135806.0 | ||
| 008 | 730522s1937 maua 000 0 eng d | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 041 | 0 | _aeng | |
| 082 | 0 | 0 |
_a153.9/3 _221 |
| 100 | 1 |
_aTerman, Lewis Madison, _d1877-1956. |
|
| 245 | 1 | 0 |
_aMeasuring intelligence : _bA guide to the administration of the new revised Stanford-Binet tests of intelligence / _cBy Lewis M. Terman and Maud A. Merrill. |
| 260 |
_aBoston ; _aNew York : _bHoughton Mifflin Co., _c[1937]. |
||
| 300 |
_axi, 460 p. : _bill., tables, diagrs. ; _c21 cm. |
||
| 440 | 0 | _aRiverside textbooks in education | |
| 650 | 0 | _aEducational tests and measurements. | |
| 700 | 1 |
_aMerrill, Maud Amanda, _db. 1888. |
|
| 740 | 0 | _aStanford-Binet tests for intelligence. | |
| 999 |
_c506601 _d506601 |
||