000			01118nam a2200277 a 4500
001			2580
003			Q Series
005			20170506185729.0
008			040827s1998 nyua 001 0 eng d
020			_a0070576971
040			_aDLC _cAUA _dAUA _a
100	1		_aRunyan, W.R.
245	1	0	_aSemiconductor measurements and instrumentation / _cby W.R. Runyan and T.J. Shaffner.
250			_a2nd ed.
260			_aNew York, N.Y. : _bMcGraw Hill, _c1998.
300			_ax, 454 p. : _bill. ; _c24 cm.
504			_aIncludes bibliographical references and index.
505	2		_aCrystal orientation--Crystal defects--Impurity concentration--Resistivity, sheet resistance, and contact resistance.
650		0	_aSemiconductors.
650		0	_aPhysical measurements.
700	1		_aShaffner, T.J.
856	4	2	_oContributor biographical information _uhttp://www.loc.gov/catdir/bios/mh041/97026081.html
856	4	2	_oPublisher description _uhttp://www.loc.gov/catdir/description/mh023/97026081.html
856	4	1	_oTable of contents _uhttp://www.loc.gov/catdir/toc/mh022/97026081.html
856	4	2	_uhttp://www.ee.mcgraw-hill.com
999			_c381532 _d381532