000 01219cas a2200349 i 4500
001 000533382
005 20230826074419.0
008 801114c19649999enkmrzp 0 a0eng d
022 0 _a0026-2714
_z0544-0173
030 _aMCRLAS
032 _a007818
_bUSPS
035 _a(OCoLC)ocm06936575
040 _aPBL
_cPBL
_dFU
_dOCoLC
_dOCoLC
_dAIP
_dNSDP
_dAIP
_dDLC
_dNST
_dNSDP
_dNST
_dDLC
_dNST
_dNSDP
_dNST
_dNSDP
_dWaU
_dCU-S
_dOCoLC
_dGU
041 0 _aeng
042 _ansdp
_alc
050 0 0 _aTK7870
_b.M456
082 _a621.381/05
210 0 _aMicroelectron. reliab.
222 0 _aMicroelectronics and reliability
245 0 0 _aMicroelectronics and reliability.
246 1 _iIssues for 1998- have title:
_aMicroelectronics reliability
260 _aOxford ;
_aNew York :
_bPergamon Press,
_c1964-.
300 _av. :
_bill. ;
_c26-27 cm.
310 _aMonthly,
_b<1997- >
321 _aFrequency varies,
_b1964-
362 0 _aVol 3, no. 1 (June 1964)-
510 2 _aChemical abstracts
_x0009-2258
650 0 _aElectronic apparatus and appliances
_xReliability
_vPeriodicals.
650 0 _aMiniature electronic equipment
_vPeriodicals.
780 0 0 _tElectronics reliability & microminiaturization
999 _c1097321
_d1097321
942 _cCR