Feldman, Leonard C. <br/><br/>
Fundamentals of Surface and Thin Film Analysis / 
L.C. Feldman & J.W. Mayer. 
 - New York :  Elsevier Science Publishing Co., Inc.,  1986. 
 - 352 p. :  fig. 
<br/><br/>Includes Bibliographical References and Index. 
<br/><br/><label>ISBN: </label>0-444-00989-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Mechanics of materials