TY  - BOOK
AU  - Teo,B.K.
TI  - EXAFS: Basic principles and data analysis 
SN  - 3540158332
U1  - 539.7/222 19
PY  - 1986///
CY  - Berlin, New York
PB  - Springer-Verlag
KW  - Extended X-ray absorption fine structure
N1  - Includes index; Bibliogr.: p. [223]-284
ER  -