Teo, B. K. <br/><br/>
EXAFS :  Basic principles and data analysis / 
Boon K. Teo. 
 - Berlin ;  New York :  Springer-Verlag,  1986. 
 - xviii, 349 p. :  ill. ;  25 cm. 
 - Inorganic chemistry concepts ;  Vol. 9 .
 - 539.7/222 .
<br/><br/> Includes index. 
<br/><br/>Bibliogr.: p. [223]-284. 
<br/><br/><label>ISBN: </label>3540158332 0387158332 (U.S.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Extended X-ray absorption fine structure.
<br/><br/><label>Dewey Class. No.: </label>539.7/222