Pattern recognition and artificial intelligence :  Towards an integration : proceedings of an International Workshop held in Amsterdam, May 18-20, 1988 / 
Ed. by Edzard S. Gelsema and Laveen N. Kanal. 
 - Amsterdam ;  New York :  North Holland :  Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co.,  1988. 
 - xv, 499 p. :  ill. ;  23 cm. 
 - Machine intelligence and pattern recognition ;  Vol. 7 .
<br/><br/>Includes bibliographies and indexes. 
<br/><br/><label>ISBN: </label>0444871373 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pattern perception.<br/>Artificial intelligence.<br/>Image processing.