TY  - BOOK
AU  - Tanner,Brian Keith
AU  - Bowen,David Keith
ED  - NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods
TI  - Characterization of crystal growth defects by X-ray methods: [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] 
SN  - 0-306-40628-4
U1  - 548/.5 19
PY  - 1980///
CY  - New York
PB  - Plenum Press
KW  - Crystals
KW  - Defects
KW  - Congresses
KW  - X-ray crystallography
N1  - "Published in cooperation with NATO Scientific Affairs Division."; Includes bibliographical references and index
ER  -