Characterization of crystal growth defects by X-ray methods :  [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / 
edited by Brian K. Tanner and D. Keith Bowen. 
 - New York :  Plenum Press,  1980. 
 - xxvi, 589 p. :  ill. ;  26 cm. 
 - NATO advanced study institutes series  Series B  Physics  v. 63 .
 - 548/.5 .
<br/><br/> "Published in cooperation with NATO Scientific Affairs Division." 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0-306-40628-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects--Congresses<br/>X-ray crystallography--Congresses.
<br/><br/><label>Dewey Class. No.: </label>548/.5