Defects in high-k gate dielectric stacks :  Nano-electronic semiconductor devices / 
Ed. by Evgeni Gusev. 
 - Dordrecht, The Netherlands :  Springer,  2006. 
 - x, 492 p. :  ill. 
 - NATO Science Series  Series II :  Mathematics, Physics and Chemistry  Vol. 220 .
<br/><br/> "Proceedings of the NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia." - Colophon. 
<br/><br/>Includes bibliogr. references and indexes 
<br/><br/><label>ISBN: </label>140204366X (PB) 1402043651 (HB) 1402043678 (e-book) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Gate array circuits--Congresses<br/>Dielectrics--Congresses<br/>Semiconductors--Defects--Congresses