Scanning probe microscopy :  Characterization, nanofabrication and device application of functional materials / 
Ed. by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon. 
 - Dordrecht ;  Boston :  Kluwer Acad. Publ.,  2005. 
 - xxxvii, 488 p. :  ill. ;  25 cm. 
 - NATO Science Series  II:  Mathematics, Physics and Chemistry  Vol. 186 .
<br/><br/>Includes bibliogr. references 
<br/><br/><label>ISBN: </label>1402030177 (acid-free paper) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials--Microscopy--Congresses<br/>Scanning probe microscopy--Congresses