An introduction to mixed-signal IC test and measurement /
by Mark Burns, Gordon W. Roberts.
- New York, N.Y. : Oxford University Press, 2001.
- xx, 684 p. : ill. ; 25 cm.
- The Oxford Series in Electrical and Computer Engineering. .
Includes bibliographical references and index.
Overview of mixed-signal testing--The test specification process--DC an parametric measurements--Measurement accuracy--Tester hardware.
0195140168
Integrated circuits--Testing. Mixed signal circuits--Testing.