Runyan, W.R. <br/><br/>
Semiconductor measurements and instrumentation / 
by W.R. Runyan and T.J. Shaffner. 
 - 2nd ed. 
 - New York, N.Y. :  McGraw Hill,  1998. 
 - x, 454 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Crystal orientation--Crystal defects--Impurity concentration--Resistivity, sheet resistance, and contact resistance. 
<br/><br/><label>ISBN: </label>0070576971 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors.<br/>Physical measurements.