TY  - BOOK
AU  - Pacchioni,G.
AU  - Skuja,L.
AU  - Griscom,D.L.
ED  - NATO Advanced Study Institute on Defects in SiO2 and Related Dielectrics : Science and Technology
TI  - Defects in SiO2 and Related Dielectrics: Science and Technology 
SN  - 0-7923-6686-7
PY  - 2000///
CY  - Dordrecht, Boston, London, Boston
PB  - Kluwer Acad. Publ
KW  - Chemistry
ER  -