Defects in SiO2 and Related Dielectrics :  Science and Technology / 
Ed. by G. Pacchioni a.o. 
 - Dordrecht ;  Boston  London :  Boston ;  Kluwer Acad. Publ,  2000. 
 - viii, 624 p. 
 - NATO Science Series  Series II  Mathematics, Physics and Chemistry  Vol. 2 .
<br/><br/><label>ISBN: </label>0-7923-6686-7 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemistry