ՄԵԸՔ մանրամասներ
| 000 -LEADER |
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| fixed length control field |
01309nam a2200289 a 4500 |
| 001 - CONTROL NUMBER |
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| control field |
000481155 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
AM-YeNLA |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20190426125459.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
060323s2006 ne |||||r|||||000|0|eng|d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
140204366X (PB) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
1402043651 (HB) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
1402043678 (e-book) |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
|
| 041 0# - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Defects in high-k gate dielectric stacks : |
| Remainder of title |
Nano-electronic semiconductor devices / |
| Statement of responsibility, etc. |
Ed. by Evgeni Gusev. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Dordrecht, The Netherlands : |
| Name of publisher, distributor, etc. |
Springer, |
| Date of publication, distribution, etc. |
2006. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
x, 492 p. : |
| Other physical details |
ill. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
NATO Science Series |
| Number of part/section of a work |
Series II : |
| Name of part/section of a work |
Mathematics, Physics and Chemistry |
| Volume/sequential designation |
Vol. 220 |
| 500 ## - GENERAL NOTE |
|---|
| General note |
"Proceedings of the NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices, held July 11-14, 2005, in St. Petersburg, Russia." - Colophon. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliogr. references and indexes |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Gate array circuits |
| Form subdivision |
Congresses |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Dielectrics |
| Form subdivision |
Congresses |
| 650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors |
| General subdivision |
Defects |
| Form subdivision |
Congresses |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Gusev, Evgeni |
| Relator code |
edt |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
North Atlantic Treaty Organization |
| Subordinate unit |
Scientific Affairs Division |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
NATO Advanced Research Workshop on Defects in High-k Dielectric Nano-electronic Semiconductor Devices |
| Date of meeting |
( 2005 : |
| Location of meeting |
St. Petersburg, Russia) |
