EXAFS :
Teo, B. K.
EXAFS : Basic principles and data analysis / Boon K. Teo. - Berlin ; New York : Springer-Verlag, 1986. - xviii, 349 p. : ill. ; 25 cm. - Inorganic chemistry concepts ; Vol. 9 . - 539.7/222 .
Includes index.
Bibliogr.: p. [223]-284.
3540158332 0387158332 (U.S.)
Extended X-ray absorption fine structure.
539.7/222
EXAFS : Basic principles and data analysis / Boon K. Teo. - Berlin ; New York : Springer-Verlag, 1986. - xviii, 349 p. : ill. ; 25 cm. - Inorganic chemistry concepts ; Vol. 9 . - 539.7/222 .
Includes index.
Bibliogr.: p. [223]-284.
3540158332 0387158332 (U.S.)
Extended X-ray absorption fine structure.
539.7/222