Նորմալ դիտում MARC դիտում ISBD Դիտում

VLSI testing / Ed. by T.W. Williams. - Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1986. - ix, 275 p. : ill. ; 25 cm. - Advances in CAD for VLSI Vol. 5 . - 621.395 .

Includes bibliographies.

ISBN: 0444878955 (U.S.)

Subjects--Topical Terms:
Integrated circuits--Very large scale integration--Testing.

Dewey Class. No.: 621.395