Նորմալ դիտում MARC դիտում ISBD Դիտում

Pattern recognition and artificial intelligence : Towards an integration : proceedings of an International Workshop held in Amsterdam, May 18-20, 1988 / Ed. by Edzard S. Gelsema and Laveen N. Kanal. - Amsterdam ; New York : North Holland : Sole distributors for the U.S.A. and Canada, Elsevier Science Publ. Co., 1988. - xv, 499 p. : ill. ; 23 cm. - Machine intelligence and pattern recognition ; Vol. 7 .

Includes bibliographies and indexes.

ISBN: 0444871373

Subjects--Topical Terms:
Pattern perception.
Artificial intelligence.
Image processing.