Characterization of crystal growth defects by X-ray methods :
Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] /
edited by Brian K. Tanner and D. Keith Bowen.
- New York : Plenum Press, 1980.
- xxvi, 589 p. : ill. ; 26 cm.
- NATO advanced study institutes series Series B Physics v. 63 .
- 548/.5 .
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index.
0-306-40628-4
Crystals--Defects--Congresses
X-ray crystallography--Congresses.
548/.5
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index.
0-306-40628-4
Crystals--Defects--Congresses
X-ray crystallography--Congresses.
548/.5